Dewetting of the three-phase contact line on solids
Liquid adsorption on a substrate has great applications in inkjet printing as well as micro/nano fabrication. In this letter, we focus on obtaining a better understanding of the pinning-dewetting phenomenon through solubility measurements during droplet evaporation. The physical adsorption/penetrati...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1999. - 26(2010), 11 vom: 01. Juni, Seite 7682-5 |
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| Weitere Verfasser: | , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2010
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Zusammenfassung: | Liquid adsorption on a substrate has great applications in inkjet printing as well as micro/nano fabrication. In this letter, we focus on obtaining a better understanding of the pinning-dewetting phenomenon through solubility measurements during droplet evaporation. The physical adsorption/penetration of liquid on the substrate material is considered to be responsible for the pinning of the three-phase contact line. Once the adsorption surrounding the contact line reaches equilibrium, dewetting occurs and the droplet shrinks. The absorption kinetics of water molecules on different substrates was monitored. An analytical technique was developed to measure the threshold adsorption density of trace solvents on these substrates including different polymers, silicon, and gold |
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| Beschreibung: | Date Completed 08.09.2010 Date Revised 25.05.2010 published: Print Citation Status PubMed-not-MEDLINE |
| ISSN: | 1520-5827 |
| DOI: | 10.1021/la101249k |