APA Zitierstil

Tian, R., Seitz, O., Li, M., Hu, W. W., Chabal, Y. J., & Gao, J. (2010). Infrared characterization of interfacial Si-O bond formation on silanized flat SiO2/Si surfaces. Langmuir : the ACS journal of surfaces and colloids, 26(7), 4563. https://doi.org/10.1021/la904597c

Chicago Zitierstil

Tian, Ruhai, Oliver Seitz, Meng Li, Wenchuang Walter Hu, Yves J. Chabal, und Jinming Gao. "Infrared Characterization of Interfacial Si-O Bond Formation on Silanized Flat SiO2/Si Surfaces." Langmuir : The ACS Journal of Surfaces and Colloids 26, no. 7 (2010): 4563. https://dx.doi.org/10.1021/la904597c.

MLA Zitierstil

Tian, Ruhai, et al. "Infrared Characterization of Interfacial Si-O Bond Formation on Silanized Flat SiO2/Si Surfaces." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 26, no. 7, 2010, p. 4563.