Use of a hexapod in diffraction measurements of substrate-supported crystals of organic semiconductors
Thin films of organic semiconductor prepared on substrates generally contain crystals that have one common crystal plane parallel to the substrate but random in-plane orientations. In diffraction measurements of these structures, it is often required to anchor the X-ray beam on a fixed spot on the s...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 16(2009), Pt 6 vom: 18. Nov., Seite 788-95 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2009
|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article Research Support, U.S. Gov't, Non-P.H.S. |
| Online verfügbar |
Volltext |