Spatial structure of a focused X-ray beam diffracted from crystals

The spatial structure of a beam focused by a planar refractive lens and Bragg diffracted from perfect silicon crystals was experimentally studied at the focal plane using a knife-edge scan and a high-resolution CCD camera. The use of refractive lenses allowed for a detailed comparison with theory. I...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 16(2009), Pt 5 vom: 15. Sept., Seite 666-71
1. Verfasser: Kazimirov, A (VerfasserIn)
Weitere Verfasser: Kohn, V G, Snigirev, A, Snigireva, I
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2009
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, N.I.H., Extramural Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S. Silicon Z4152N8IUI
LEADER 01000caa a22002652c 4500
001 NLM190981695
003 DE-627
005 20250714161624.0
007 cr uuu---uuuuu
008 231223s2009 xx |||||o 00| ||eng c
024 7 |a 10.1107/S0909049509029860  |2 doi 
028 5 2 |a pubmed25n1427.xml 
035 |a (DE-627)NLM190981695 
035 |a (NLM)19713641 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Kazimirov, A  |e verfasserin  |4 aut 
245 1 0 |a Spatial structure of a focused X-ray beam diffracted from crystals 
264 1 |c 2009 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 02.11.2009 
500 |a Date Revised 29.05.2025 
500 |a published: Print-Electronic 
500 |a Citation Status MEDLINE 
520 |a The spatial structure of a beam focused by a planar refractive lens and Bragg diffracted from perfect silicon crystals was experimentally studied at the focal plane using a knife-edge scan and a high-resolution CCD camera. The use of refractive lenses allowed for a detailed comparison with theory. It was shown that diffraction leads to broadening of the focused beam owing to the extinction effect and, for a sufficiently thin crystal, to the appearance of a second peak owing to reflection from the back surface. It was found that the spatial structure of the diffracted beam depends on whether the crystal diffracts strongly (dynamically) or weakly (kinematically). The results help to understand the physical origin of the diffracted intensity recorded in a typical microbeam diffraction experiment 
650 4 |a Journal Article 
650 4 |a Research Support, N.I.H., Extramural 
650 4 |a Research Support, Non-U.S. Gov't 
650 4 |a Research Support, U.S. Gov't, Non-P.H.S. 
650 7 |a Silicon  |2 NLM 
650 7 |a Z4152N8IUI  |2 NLM 
700 1 |a Kohn, V G  |e verfasserin  |4 aut 
700 1 |a Snigirev, A  |e verfasserin  |4 aut 
700 1 |a Snigireva, I  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Journal of synchrotron radiation  |d 1994  |g 16(2009), Pt 5 vom: 15. Sept., Seite 666-71  |w (DE-627)NLM09824129X  |x 1600-5775  |7 nnas 
773 1 8 |g volume:16  |g year:2009  |g number:Pt 5  |g day:15  |g month:09  |g pages:666-71 
856 4 0 |u http://dx.doi.org/10.1107/S0909049509029860  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_40 
912 |a GBV_ILN_350 
912 |a GBV_ILN_2005 
951 |a AR 
952 |d 16  |j 2009  |e Pt 5  |b 15  |c 09  |h 666-71