Quantitative characterization of nanoadhesion by dynamic force spectroscopy

We present a method for the characterization of adhesive bonds formed in nanocontacts. Using a modified atomic force microscope, the nanoadhesion between a silicon nitride tip and a self-assembled monolayer of 1-nonanethiol on gold(111) was measured at different loading rates. Adhesion force-versus-...

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Détails bibliographiques
Publié dans:Langmuir : the ACS journal of surfaces and colloids. - 1985. - 25(2009), 1 vom: 06. Jan., Seite 256-61
Auteur principal: Ptak, Arkadiusz (Auteur)
Autres auteurs: Kappl, Michael, Moreno-Flores, Susana, Gojzewski, Hubert, Butt, Hans-Jürgen
Format: Article en ligne
Langue:English
Publié: 2009
Accès à la collection:Langmuir : the ACS journal of surfaces and colloids
Sujets:Journal Article Research Support, Non-U.S. Gov't
Description
Résumé:We present a method for the characterization of adhesive bonds formed in nanocontacts. Using a modified atomic force microscope, the nanoadhesion between a silicon nitride tip and a self-assembled monolayer of 1-nonanethiol on gold(111) was measured at different loading rates. Adhesion force-versus-loading rate curves could be fitted with two logarithmic terms, indicating a two step (two energy barrier) process. The application of the Bell-Evans model and classical contact mechanics allows the extraction of quantitative information about the effective adhesion potential and characterization of the different components contributing to nanoadhesion
Description:Date Completed 27.02.2009
Date Revised 31.12.2008
published: Print
Citation Status MEDLINE
ISSN:1520-5827
DOI:10.1021/la8028676