Quantitative characterization of nanoadhesion by dynamic force spectroscopy
We present a method for the characterization of adhesive bonds formed in nanocontacts. Using a modified atomic force microscope, the nanoadhesion between a silicon nitride tip and a self-assembled monolayer of 1-nonanethiol on gold(111) was measured at different loading rates. Adhesion force-versus-...
Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 25(2009), 1 vom: 06. Jan., Seite 256-61 |
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Auteur principal: | |
Autres auteurs: | , , , |
Format: | Article en ligne |
Langue: | English |
Publié: |
2009
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Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
Sujets: | Journal Article Research Support, Non-U.S. Gov't |
Résumé: | We present a method for the characterization of adhesive bonds formed in nanocontacts. Using a modified atomic force microscope, the nanoadhesion between a silicon nitride tip and a self-assembled monolayer of 1-nonanethiol on gold(111) was measured at different loading rates. Adhesion force-versus-loading rate curves could be fitted with two logarithmic terms, indicating a two step (two energy barrier) process. The application of the Bell-Evans model and classical contact mechanics allows the extraction of quantitative information about the effective adhesion potential and characterization of the different components contributing to nanoadhesion |
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Description: | Date Completed 27.02.2009 Date Revised 31.12.2008 published: Print Citation Status MEDLINE |
ISSN: | 1520-5827 |
DOI: | 10.1021/la8028676 |