Effect of solution concentration, surface bias and protonation on the dynamic response of amplitude-modulated atomic force microscopy in water
The dynamic response of amplitude-modulated atomic force microscopy (AM-AFM) is studied at the solid/water interface with respect to changes in ionic concentration, applied surface potential, and surface protonation. Each affects the electric double layer in the solution, charge on the tip and the s...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 24(2008), 19 vom: 07. Okt., Seite 10817-24 |
|---|---|
| Auteur principal: | |
| Autres auteurs: | , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2008
|
| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Journal Article |
| Accès en ligne |
Volltext |