Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells
Freeze-etching, the practice of removing excess surface water from a sample through sublimation into the vacuum of the analysis environment, has been extensively used in conjunction with electron microscopy. Here, we apply this technique to time-of-flight secondary-ion mass spectrometry (ToF-SIMS) i...
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Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 24(2008), 15 vom: 05. Aug., Seite 7906-11
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| 1. Verfasser: |
Piehowski, Paul D
(VerfasserIn) |
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| Weitere Verfasser: |
Kurczy, Michael E,
Willingham, David,
Parry, Shawn,
Heien, Michael L,
Winograd, Nicholas,
Ewing, Andrew G |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2008
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
Research Support, N.I.H., Extramural
Research Support, Non-U.S. Gov't
Water
059QF0KO0R |
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