Chemical imaging of the surface of self-assembled polystyrene-b-poly(methyl methacrylate) diblock copolymer films using apertureless near-field IR microscopy
The nanoscale chemical composition variations of the surfaces of thin films of polystyrene- b-poly(methyl methacrylate) (PS- b-PMMA) diblock copolymers are investigated using apertureless near-field IR microscopy. The scattering of the incident infrared beam from a modulated atomic force microscopy...
Ausführliche Beschreibung
Bibliographische Detailangaben
Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 24(2008), 13 vom: 01. Juni, Seite 6946-51
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1. Verfasser: |
Mueller, Kerstin
(VerfasserIn) |
Weitere Verfasser: |
Yang, Xiujuan,
Paulite, Melissa,
Fakhraai, Zahra,
Gunari, Nikhil,
Walker, Gilbert C |
Format: | Online-Aufsatz
|
Sprache: | English |
Veröffentlicht: |
2008
|
Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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Schlagworte: | Journal Article
Research Support, N.I.H., Extramural
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.
Methacrylates
Polystyrenes
polystyrene-block-poly(methyl methacrylate) |