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231223s2008 xx |||||o 00| ||eng c |
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|a 10.1109/TUFFC.2008.754
|2 doi
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|a pubmed25n0600.xml
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|a (DE-627)NLM17994441X
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|a (NLM)18519210
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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1 |
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|a Naganuma, H
|e verfasserin
|4 aut
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|a Dependence of ferroelectric and magnetic properties on measuring temperatures for polycrystalline BiFeO(3) films
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|c 2008
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
|b cr
|2 rdacarrier
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|a Date Completed 08.07.2008
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|a Date Revised 24.11.2016
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|a published: Print
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|a Citation Status MEDLINE
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|a A multiferroic BiFeO(3) film was fabricated on a Pt/Ti/SiO(3)/Si(100) substrate by a chemical solution deposition (CSD) method, and this was followed by postdeposition annealing at 923 K for 10 min in air. X-ray diffraction analysis indicated the formation of the polycrystalline single phase of the BiFeO(3) film. A high remanent polarization of 89 microC/cm(2) was observed at 90 K together with a relatively low electric coercive field of 0.32 MV/cm, although the ferroelectric hysteresis loops could not be observed at room temperature due to a high leakage current density. The temperature dependence of the ferroelectric hysteresis loops indicated that these hysteresis loops lose their shape above 165 K, and the nominal remanent polarization drastically increased due to the leakage current. Magnetic measurements indicated that the saturation magnetization was less than 1 emu/cm(3) at room temperature and increased to approximately 2 emu/cm(3) at 100 K, although the spontaneous magnetization could not appear. The magnetization curves of polycrystalline BiFeO3 film were nonlinear at both temperatures, which is different with BiFeO3 single crystal
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|a Journal Article
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|a Research Support, Non-U.S. Gov't
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|a Ferric Compounds
|2 NLM
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|a Membranes, Artificial
|2 NLM
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|a ferric oxide
|2 NLM
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|a 1K09F3G675
|2 NLM
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|a bismuth oxide
|2 NLM
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|a A6I4E79QF1
|2 NLM
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|a Bismuth
|2 NLM
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|a U015TT5I8H
|2 NLM
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| 700 |
1 |
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|a Inoue, Y
|e verfasserin
|4 aut
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|a Okamura, S
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t IEEE transactions on ultrasonics, ferroelectrics, and frequency control
|d 1986
|g 55(2008), 5 vom: 01. Mai, Seite 1046-50
|w (DE-627)NLM098181017
|x 1525-8955
|7 nnas
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| 773 |
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|g volume:55
|g year:2008
|g number:5
|g day:01
|g month:05
|g pages:1046-50
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|u http://dx.doi.org/10.1109/TUFFC.2008.754
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