An application of polarized domains in ferroelectric thin films using scanning probe microscope
The feasibility of utilizing PZT films as future data storage media was investigated using a modified AFM. Applying voltages between a conductive AFM tip and the PZT films causes the switching of ferroelectric domains. The domains are observed using an EFM imaging technique. The experimental results...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 47(2000), 4 vom: 28., Seite 801-7
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| 1. Verfasser: |
Shin, H
(VerfasserIn) |
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| Weitere Verfasser: |
Lee, K M,
Moon, W K,
Jeon, J U,
Lim, G,
Pak, Y E,
Park, J H,
Yoon, K H |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2000
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control
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| Schlagworte: | Journal Article |
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