Flicker noise measurement of HF quartz resonators
Frequency flicker of quartz resonators can be derived from the measurement of S(phi) (f), i.e., the power spectrum density of phase fluctuations phi. The interferometric method appears to be the best choice to measure the phase fluctuations of the quartz resonators because of its high sensitivity in...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 47(2000), 2 vom: 28., Seite 361-8
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| 1. Verfasser: |
Rubiola, E
(VerfasserIn) |
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| Weitere Verfasser: |
Groslambert, J,
Brunet, M,
Giordano, V |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2000
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control
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| Schlagworte: | Journal Article |
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