Style de citation APA

Yi, J. M., Chu, Y. S., Argunova, T. S., Domagala, J. Z., & Je, J. H. (2008). X-ray diffractometry and topography of lattice plane curvature in thermally deformed Si wafer. Journal of synchrotron radiation, 15(Pt 1), 96.

Style de citation Chicago

Yi, J M., Y S. Chu, T S. Argunova, J Z. Domagala, et J H. Je. "X-ray Diffractometry and Topography of Lattice Plane Curvature in Thermally Deformed Si Wafer." Journal of Synchrotron Radiation 15, no. Pt 1 (2008): 96.

Style de citation MLA

Yi, J M., et al. "X-ray Diffractometry and Topography of Lattice Plane Curvature in Thermally Deformed Si Wafer." Journal of Synchrotron Radiation, vol. 15, no. Pt 1, 2008, p. 96.