Formation of n-alkane layers at the vapor/water interface

We present a study on the initial wetting behaviors of two low molecular weight alkanes, heptane and octane, at the vapor/water interface using both neutron and X-ray reflectometry. Combined X-ray and neutron reflectivity studies data showed that a uniform film, which has never been reported, was fo...

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Détails bibliographiques
Publié dans:Langmuir : the ACS journal of surfaces and colloids. - 1985. - 23(2007), 24 vom: 20. Nov., Seite 12249-53
Auteur principal: Kwon, Oh-Sun (Auteur)
Autres auteurs: Jing, Huaiyu, Shin, Kwanwoo, Wang, Xiaohui, Satija, Sushil K
Format: Article
Langue:English
Publié: 2007
Accès à la collection:Langmuir : the ACS journal of surfaces and colloids
Sujets:Journal Article Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S. Alkanes Gases Heptanes Octanes Water 059QF0KO0R octane X1RV0B2FJV
Description
Résumé:We present a study on the initial wetting behaviors of two low molecular weight alkanes, heptane and octane, at the vapor/water interface using both neutron and X-ray reflectometry. Combined X-ray and neutron reflectivity studies data showed that a uniform film, which has never been reported, was formed continuously at 25 degrees C. As the adsorptive deposition continued, each adsorbed film was saturated at a specific equilibrium thickness: 48 and 36 A for deuterated heptane and octane, respectively, and 21 A for hydrogenated octane. The thickness of the adsorbed layer measured by neutron reflectivity is in agreement with that measured using X-ray reflectivity. Our observations of continuous and saturated adsorption behaviors are analyzed qualitatively using a kinetic adsorption model
Description:Date Completed 08.02.2008
Date Revised 21.11.2013
published: Print-Electronic
Citation Status MEDLINE
ISSN:1520-5827