Probing atomic displacements with thermal differential EXAFS
Differential extended X-ray absorption fine structure (DiffEXAFS) is a novel technique for the study of small atomic strains. Here the development of this technique to the measurement of thermally induced strain is presented. Thermal DiffEXAFS measurements have been performed on alpha-Fe and SrF(2),...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 14(2007), Pt 5 vom: 25. Sept., Seite 421-5 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2007
|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |