Phase transition of alkylsilane monolayers studied by temperature-dependent grazing incidence X-ray diffraction
The phase transition of organosilane monolayers on Si-wafer substrate surfaces prepared from octadecyltrichlorosilane (OTS) or docosyltrichlorosilane (DOTS) was investigated on the basis of grazing incidence X-ray diffraction (GIXD) at various temperatures. The OTS monolayer was prepared by a chemis...
Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 23(2007), 17 vom: 14. Aug., Seite 8861-5 |
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Weitere Verfasser: | , , , |
Format: | Aufsatz |
Sprache: | English |
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2007
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Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
Schlagworte: | Journal Article |