A bayesian approach to deformed pattern matching of iris images
We describe a general probabilistic framework for matching patterns that experience in-plane nonlinear deformations, such as iris patterns. Given a pair of images, we derive a maximum a posteriori probability (MAP) estimate of the parameters of the relative deformation between them. Our estimation p...
| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence. - 1979. - 29(2007), 4 vom: 13. Apr., Seite 596-606 |
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| Format: | Aufsatz |
| Sprache: | English |
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2007
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on pattern analysis and machine intelligence |
| Schlagworte: | Evaluation Study Journal Article Research Support, Non-U.S. Gov't |