Correction of random surface roughness on colloidal probes in measuring adhesion
Atomic force microscopes (AFM) are commonly used to measure adhesion at nanoscale between two surfaces. To avoid uncertainties in the contact areas between the tip and the surface, colloidal probes have been used for adhesion measurements. We measured adhesion between glass spheres and silicon (100)...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 23(2007), 3 vom: 30. Jan., Seite 1195-202 |
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| Format: | Aufsatz |
| Sprache: | English |
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2007
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |