Measuring molecular order in poly(3-alkylthiophene) thin films with polarizing spectroscopies
We measured the molecular order of poly(3-alkylthiophene) chains in thin films before and after melting through the combination of several polarized photon spectroscopies: infrared (IR) absorption, variable angle spectroscopic ellipsometry (SE), and near-edge X-ray absorption fine structure (NEXAFS)...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1991. - 23(2007), 2 vom: 16. Jan., Seite 834-42 |
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| Auteur principal: | |
| Autres auteurs: | , , , , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2007
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Journal Article Research Support, U.S. Gov't, Non-P.H.S. Polymers Thiophenes |