Measurement of apparent diffusion coefficients within ultrathin nafion Langmuir-Schaefer films : comparison of a novel scanning electrochemical microscopy approach with cyclic voltammetry
The use of scanning electrochemical microscopy (SECM) to evaluate the apparent diffusion coefficient, Dapp, of redox-active species in ultrathin Nafion films is described. In this technique, an ultramicroelectrode (UME) tip, positioned close to a film on a macroscopic electrode, is used to oxidize (...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 22(2006), 25 vom: 05. Dez., Seite 10380-8 |
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| Auteur principal: | |
| Autres auteurs: | , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2006
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Comparative Study Journal Article Research Support, Non-U.S. Gov't Fluorocarbon Polymers Membranes, Artificial perfluorosulfonic acid 39464-59-0 |