Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film
The information depth of near-edge X-ray absorption fine structure spectroscopy in the total electron yield mode (TEY-NEXAFS) is given by the escape depth of the TEY electrons z(TEY). This is determined by the effective ranges both of the inelastically scattered secondary electrons and of the primar...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1991. - 22(2006), 20 vom: 26. Sept., Seite 8587-94 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2006
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |