APA Zitierstil

Chua, L., Dipankar, M., Sivaramakrishnan, S., Gao, X., Qi, D., Wee, A. T. S., & Ho, P. K. H. (2006). Large damage threshold and small electron escape depth in X-ray absorption spectroscopy of a conjugated polymer thin film. Langmuir : the ACS journal of surfaces and colloids, 22(20), 8587.

Chicago Zitierstil

Chua, Lay-Lay, Mandal Dipankar, Sankaran Sivaramakrishnan, Xingyu Gao, Dongchen Qi, Andrew T S. Wee, und Peter K H. Ho. "Large Damage Threshold and Small Electron Escape Depth in X-ray Absorption Spectroscopy of a Conjugated Polymer Thin Film." Langmuir : The ACS Journal of Surfaces and Colloids 22, no. 20 (2006): 8587.

MLA Zitierstil

Chua, Lay-Lay, et al. "Large Damage Threshold and Small Electron Escape Depth in X-ray Absorption Spectroscopy of a Conjugated Polymer Thin Film." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 22, no. 20, 2006, p. 8587.