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|a pubmed25n0546.xml
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|a (DE-627)NLM163740151
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|a (NLM)16799220
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|a DE-627
|b ger
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|e rakwb
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|a eng
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|a Fenter, P
|e verfasserin
|4 aut
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|a On the use of CCD area detectors for high-resolution specular X-ray reflectivity
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|c 2006
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 05.09.2006
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|a Date Revised 15.11.2006
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|a published: Print-Electronic
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|a Citation Status MEDLINE
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|a The use and application of charge coupled device (CCD) area detectors for high-resolution specular X-ray reflectivity is discussed. Direct comparison of high-resolution specular X-ray reflectivity data measured with CCD area detectors and traditional X-ray scintillator ('point') detectors demonstrates that the use of CCD detectors leads to a substantial (approximately 30-fold) reduction in data acquisition rates because of the elimination of the need to scan the sample to distinguish signal from background. The angular resolution with a CCD detector is also improved by a factor of approximately 3. The ability to probe the large dynamic range inherent to high-resolution X-ray reflectivity data in the specular reflection geometry was demonstrated with measurements of the orthoclase (001)- and alpha-Al2O3 (012)-water interfaces, with measured reflectivity signals varying by a factor of approximately 10(6) without the use of any beam attenuators. Statistical errors in the reflectivity signal are also derived and directly compared with the repeatability of the measurements
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|a Journal Article
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|a Research Support, U.S. Gov't, Non-P.H.S.
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|a Review
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|a Catalano, J G
|e verfasserin
|4 aut
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|a Park, C
|e verfasserin
|4 aut
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|a Zhang, Z
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 13(2006), Pt 4 vom: 01. Juli, Seite 293-303
|w (DE-627)NLM09824129X
|x 0909-0495
|7 nnns
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|g volume:13
|g year:2006
|g number:Pt 4
|g day:01
|g month:07
|g pages:293-303
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|a GBV_ILN_2005
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|a AR
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|d 13
|j 2006
|e Pt 4
|b 01
|c 07
|h 293-303
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