Investigating activated sludge flocs using microanalytical techniques demonstration of environmental scanning electron microscopy and time-of-flight secondary ion mass spectrometry for wastewater applications

Investigating activated sludge flocs using microanalytical techniques : demonstration of environmental scanning electron microscopy and time-of-flight secondary ion mass spectrometry for wastewater applications

Environmental scanning electron microscopy (ESEM) with an energy-dispersive X-ray spectrometer (EDS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were demonstrated to be useful analytical tools for investigating surface and bulk components of individual floc particles from both full...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:Water environment research : a research publication of the Water Environment Federation. - 1998. - 78(2006), 4 vom: 31. Apr., Seite 381-91
1. Verfasser: Holbrook, R David (VerfasserIn)
Weitere Verfasser: Wagner, Matthew S, Mahoney, Christine M, Wight, Scott A
Format: Aufsatz
Sprache:English
Veröffentlicht: 2006
Zugriff auf das übergeordnete Werk:Water environment research : a research publication of the Water Environment Federation
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Sewage Water Pollutants