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20231223095319.0 |
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231223s1995 xx ||||| 00| ||eng c |
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|a pubmed24n0543.xml
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|a (DE-627)NLM162952538
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|a (NLM)16714796
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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| 100 |
1 |
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|a Oyanagi, H
|e verfasserin
|4 aut
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| 245 |
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|a Surface-Sensitive XAFS in the Hard X-ray Region with Sub-Monolayer Sensitivity
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| 264 |
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|c 1995
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| 336 |
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|a Text
|b txt
|2 rdacontent
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| 337 |
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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| 338 |
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 02.10.2012
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|a Date Revised 22.05.2006
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|a published: Print
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|a Citation Status PubMed-not-MEDLINE
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|a Surface-sensitive X-ray absorption fine structure (XAFS) with sub-monolayer sensitivity based on grazing-incidence fluorescence detection is reported. The efficiency of fluorescence detection increased by more than two orders of magnitude by combining a multipole wiggler with a multi-element Si(Li) solid-state detector. The capability of the present technique for structural studies of surfaces and buried interfaces in the hard X-ray region was demonstrated by As K-edge XAFS studies of the InP(001) surface exposed to AsH(3) flow. The results indicated that ~0.1 monolayer As atoms are incorporated into the surface replacing the P atoms
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| 650 |
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|a Journal Article
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1 |
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|a Shioda, R
|e verfasserin
|4 aut
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1 |
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|a Kuwahara, Y
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Haga, K
|e verfasserin
|4 aut
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| 773 |
0 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 2(1995), Pt 2 vom: 01. März, Seite 99-105
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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| 773 |
1 |
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|g volume:2
|g year:1995
|g number:Pt 2
|g day:01
|g month:03
|g pages:99-105
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|a GBV_ILN_2005
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|a AR
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| 952 |
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|d 2
|j 1995
|e Pt 2
|b 01
|c 03
|h 99-105
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