Rapid mapping of texture in polycrystalline materials using an imaging plate on a synchrotron radiation source
Taking advantage of the high brilliance of synchrotron radiation, a system was developed for rapid mapping of the orientation distribution of crystal grains (texture) in polycrystalline materials using an imaging plate. A monochromatized beam is incident on the sample, which is rotated using the ome...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 2(1995), Pt 1 vom: 01. Jan., Seite 49-55 |
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| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
1995
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |
| Zusammenfassung: | Taking advantage of the high brilliance of synchrotron radiation, a system was developed for rapid mapping of the orientation distribution of crystal grains (texture) in polycrystalline materials using an imaging plate. A monochromatized beam is incident on the sample, which is rotated using the omega-axis mechanism of an X-ray diffractometer so that the surface of the sphere of poles of the selected reflection is scanned by the Ewald sphere. Simultaneously, the imaging plate is translated vertically with a velocity that is synchronized with that of the sample rotation. It is possible to record pole figures over an extended angular range within a short period of time, typically of the order of minutes. The method has been applied to the observation of a time change in the orientation distribution of metal sheets at elevated temperatures |
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| Beschreibung: | Date Completed 02.10.2012 Date Revised 22.05.2006 published: Print Citation Status PubMed-not-MEDLINE |
| ISSN: | 1600-5775 |