Extraction of accurate structure-factor amplitudes from Laue data : wavelength normalization with wiggler and undulator X-ray sources
Wavelength normalization is an essential part of processing of Laue X-ray diffraction data and is critically important for deriving accurate structure-factor amplitudes. The results of wavelength normalization for Laue data obtained in nanosecond time-resolved experiments at the ID09 beamline at the...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 7(2000), Pt 4 vom: 01. Juli, Seite 236-44 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , , , , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2000
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |