Charge densities from high-resolution synchrotron X-ray diffraction experiments
The combination of intense X-ray sources, especially synchrotron radiation, with area-detector technology has accomplished an enormous advance in the experimental conditions available for charge-density analysis by single-crystal high-resolution X-ray diffraction. Such experiments can now be carried...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 7(2000), Pt 3 vom: 01. Mai, Seite 160-6 |
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| Auteur principal: | |
| Autres auteurs: | , , , , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2000
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article |