Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope

An X-ray fluorescence imaging microscope with a Wolter-type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring-8. Monochromatic X-rays (DeltaE/E approximately 10(-4)) in the energy range 6-10 keV were used for X-ray fluorescence excitation of the specimens. Using tw...

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Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 7(2000), Pt 1 vom: 01. Jan., Seite 34-9
1. Verfasser: Yamamoto, K (VerfasserIn)
Weitere Verfasser: Watanabe, N, Takeuchi, A, Takano, H, Aota, T, Fukuda, M, Aoki, S
Format: Aufsatz
Sprache:English
Veröffentlicht: 2000
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article
Beschreibung
Zusammenfassung:An X-ray fluorescence imaging microscope with a Wolter-type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring-8. Monochromatic X-rays (DeltaE/E approximately 10(-4)) in the energy range 6-10 keV were used for X-ray fluorescence excitation of the specimens. Using two monochromatic X-rays above and below the absorption edge of a particular element, a two-dimensional image of the element could be obtained. As a result, two-dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite-quartz schist) became possible
Beschreibung:Date Completed 16.05.2006
Date Revised 12.04.2006
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775