A new approach to measuring high-resolution magnetic Compton profiles
It is demonstrated that long-term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid-state detector and the traditional method...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 13(2006), Pt 2 vom: 01. März, Seite 221-4 |
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| Auteur principal: | |
| Autres auteurs: | , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2006
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article |