Using the adhesive interaction between atomic force microscopy tips and polymer surfaces to measure the elastic modulus of compliant samples
An atomic force microscope (AFM) method for measuring surface elasticity based on the adhesive interactions between an AFM tip and sample surfaces is introduced. The method is particularly useful when there is a large adhesion between the tip and soft samples, when the indentation method would be le...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 20(2004), 14 vom: 06. Juli, Seite 5837-45 |
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| Weitere Verfasser: | , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2004
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |