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231223s2005 xx ||||| 00| ||eng c |
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|a (NLM)16343015
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|e rakwb
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|a eng
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1 |
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|a Boissiere, Cédric
|e verfasserin
|4 aut
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|a Porosity and mechanical properties of mesoporous thin films assessed by environmental ellipsometric porosimetry
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|c 2005
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 19.07.2007
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|a Date Revised 13.12.2005
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|a published: Print
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|a Citation Status PubMed-not-MEDLINE
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|a Mesoordered silica thin films with cubic structures were prepared by evaporation induced self-assembly (EISA) with two types of structuring agent (CTAB and block copolymer F127). A complete and accurate description of these films was obtained by combining 2D-SAXS analyses, variable angle spectroscopic ellipsometry, and a specially designed environmental ellipsometric porosimetry (EEP) experiment. The EEP analysis is rapid and cheap and operates at ambient pressure and temperature. This latter experiment was performed with water and produced a set of water adsorption-desorption isotherms. A modified Kelvin equation, coupled with a modelisation of pores contraction, enabled the determination of the structural parameters of films porous networks: ellipsoidal pore diameters, porous volume, and surface area. Young moduli of films in the direction perpendicular to the substrates were calculated from these parameters
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|a Journal Article
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|a Grosso, David
|e verfasserin
|4 aut
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1 |
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|a Lepoutre, Sophie
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Nicole, Lionel
|e verfasserin
|4 aut
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1 |
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|a Bruneau, Aline Brunet
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Sanchez, Clément
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Langmuir : the ACS journal of surfaces and colloids
|d 1992
|g 21(2005), 26 vom: 20. Dez., Seite 12362-71
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|x 1520-5827
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|g volume:21
|g year:2005
|g number:26
|g day:20
|g month:12
|g pages:12362-71
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