Pulsed laser deposition chamber for in situ X-ray diffraction
A sample chamber has been constructed for studying the growth of thin films by pulsed laser deposition in situ with surface X-ray diffraction. The achievable temperature ranges from room temperature to 1073 K in a controlled oxygen environment. The partial pressure of the oxygen background gas cover...
Veröffentlicht in: | Journal of synchrotron radiation. - 1998. - 12(2005), Pt 6 vom: 22. Nov., Seite 833-4 |
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1. Verfasser: | |
Weitere Verfasser: | , , , |
Format: | Aufsatz |
Sprache: | English |
Veröffentlicht: |
2005
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
Schlagworte: | Journal Article |