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|a pubmed24n0525.xml
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|a (DE-627)NLM157597385
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|a (NLM)16142982
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|a DE-627
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|e rakwb
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|a eng
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|a Graubner, Vera-Maria
|e verfasserin
|4 aut
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|a Neutron reflectometry and spectroscopic ellipsometry studies of cross-linked poly(dimethylsiloxane) after irradiation at 172 nm
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|c 2005
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|b nc
|2 rdacarrier
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|a Date Completed 28.03.2007
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|a Date Revised 06.09.2005
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|a published: Print
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|a Citation Status PubMed-not-MEDLINE
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|a Poly(dimethylsiloxane) (PDMS) was irradiated under ambient conditions in air with a Xe2-excimer lamp. The formation of atomic oxygen and ozone during irradiation in air by V-UV photons results in the transformation of PDMS to silicon oxide. The irradiated surfaces were studied by spectroscopic ellipsometry and neutron reflectometry. The measurements revealed the formation of a rough, i.e., between 11 and 20 nm, oxidized surface layer and a decrease of the total layer thickness. The thickness of the oxidized layer decreased for a given PDMS thickness when the polymer was irradiated for longer times and/or higher intensities. The composition of the oxidized layer after irradiation was not uniform through the layer and consisted of a mixture of original polymer and silicon bonded to three or four oxygen atoms (SiOx). The refractive index n determined by ellipsometry reaches a value similar to values reported for SiO2
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|a Journal Article
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|a Clemens, Daniel
|e verfasserin
|4 aut
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|a Gutberlet, Thomas
|e verfasserin
|4 aut
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|a Kötz, Rüdiger
|e verfasserin
|4 aut
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| 700 |
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|a Lippert, Thomas
|e verfasserin
|4 aut
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| 700 |
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|a Nuyken, Oskar
|e verfasserin
|4 aut
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|a Schnyder, Bernhard
|e verfasserin
|4 aut
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|a Wokaun, Alexander
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Langmuir : the ACS journal of surfaces and colloids
|d 1992
|g 21(2005), 19 vom: 13. Sept., Seite 8940-6
|w (DE-627)NLM098181009
|x 1520-5827
|7 nnns
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| 773 |
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|g volume:21
|g year:2005
|g number:19
|g day:13
|g month:09
|g pages:8940-6
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|d 21
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|e 19
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|h 8940-6
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