Performance of a dispersion-compensating scanning X-ray spectrometer for Compton profile measurements
A new X-ray spectrometer has been constructed for Compton profile measurements at beamline ID15B of the ESRF. The spectrometer is based on a novel idea, dispersion compensation, which was proposed earlier. A cylindrically bent Laue monochromator focuses approximately 90 keV synchrotron radiation at...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 12(2005), Pt 5 vom: 25. Sept., Seite 670-4 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2005
|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |