Adapting polychromatic X-ray microdiffraction techniques to high-pressure research : energy scan approach
Polychromatic single-crystal diffraction (pSXD) offers important advantages compared with monochromatic diffraction, such as ultrafast data collection and the ability to collect diffraction data without sample rotation. Despite the relevance of these advantages for applications in high-pressure expe...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1998. - 12(2005), Pt 5 vom: 25. Sept., Seite 608-17 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2005
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |