Self-assembled monolayers of semifluorinated alkaneselenolates on noble metal substrates
Self-assembled monolayers (SAMs) formed from semifluorinated dialkyldiselenol (CF(3)(CF(2))(5)(CH(2))(2)Se-)(2) (F6H2SeSeH2F6) on polycrystalline Au(111) and Ag(111) were characterized by high-resolution X-ray photoelectron spectroscopy, infrared reflection absorption spectroscopy, near edge X-ray a...
Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 21(2005), 18 vom: 30. Aug., Seite 8204-13 |
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1. Verfasser: | |
Weitere Verfasser: | , , , |
Format: | Aufsatz |
Sprache: | English |
Veröffentlicht: |
2005
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Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
Schlagworte: | Journal Article |
Zusammenfassung: | Self-assembled monolayers (SAMs) formed from semifluorinated dialkyldiselenol (CF(3)(CF(2))(5)(CH(2))(2)Se-)(2) (F6H2SeSeH2F6) on polycrystalline Au(111) and Ag(111) were characterized by high-resolution X-ray photoelectron spectroscopy, infrared reflection absorption spectroscopy, near edge X-ray absorption fine structure spectroscopy, scanning tunneling microscopy, and contact angle measurements. The Se-Se linkage of F6H2SeSeH2F6 was found to be cleaved upon the adsorption, followed by the formation of selenolate-metal bond. The resulting F6H2Se SAMs are well-ordered, densely packed, and contamination-free. The packing density of these films is governed by the bulky fluorocarbon part, which exhibits the expected helical conformation. A noncommensurate hexagonal arrangement of the F6H2Se molecules with an average nearest-neighbor spacing of about 5.8 +/- 0.2 A, close to the van der Waals diameter the fluorocarbon chain, was observed on Au(111). The orientation of the fluorocarbon chains in the F6H2Se SAMs does not depend on the substrate-the average tilt angle of these moieties was estimated to be about 21-22 degrees on both Au and Ag |
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Beschreibung: | Date Completed 20.03.2007 Date Revised 23.08.2005 published: Print Citation Status PubMed-not-MEDLINE |
ISSN: | 1520-5827 |