Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces

Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces

The effect of roughness on the dewetting behavior of polyethylene thin films on silicon dioxide substrates is presented. Smooth and rough silicon dioxide substrates of 0.3 and 3.2-3.9 nm root-mean-square roughness were prepared by thermal oxidation of silicon wafers and plasma-enhanced chemical vapo...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1992. - 21(2005), 16 vom: 02. Aug., Seite 7427-32
1. Verfasser: Zhang, Fajun (VerfasserIn)
Weitere Verfasser: Baralia, Gabriel, Boborodea, Adrian, Bailly, Christian, Nysten, Bernard, Jonas, Alain M
Format: Aufsatz
Sprache:English
Veröffentlicht: 2005
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Polymers Silicon Dioxide 7631-86-9 Polyethylene 9002-88-4