Direct measurement of the counterion distribution within swollen polyelectrolyte films
The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 21(2005), 15 vom: 19. Juli, Seite 6647-51 |
|---|---|
| Auteur principal: | |
| Autres auteurs: | , , , , , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2005
|
| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Journal Article |
| Résumé: | The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications |
|---|---|
| Description: | Date Completed 11.09.2006 Date Revised 12.07.2005 published: Print Citation Status PubMed-not-MEDLINE |
| ISSN: | 1520-5827 |