Phase separation in class II organically modified silicate films as probed by phase-imaging atomic force microscopy
Phase imaging tapping mode atomic force microscopy has been used to examine the presence and extent of phase separation in organically modified silicate films. A total of seven films were prepared using two different synthetic routes (cohydrolysis/condensation and separate hydrolysis/condensation) w...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 21(2005), 14 vom: 05. Juli, Seite 6137-41 |
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| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2005
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |