Nanoscale high-frequency contact mechanics using an AFM tip and a quartz crystal resonator
The transmission of high-frequency shear stress through a microscopic contact between an AFM tip and an oscillating quartz plate was measured as a function of vertical pressure, amplitude, and surface properties by monitoring the MHz component of the tip's deflection. For dry surfaces, the tran...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 20(2004), 9 vom: 27. Apr., Seite 3698-703 |
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| Format: | Aufsatz |
| Sprache: | English |
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2004
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |