Preparing contamination-free mica substrates for surface characterization, force measurements, and imaging
Due to its perfect cleavage that provides large areas of molecularly smooth, chemically inert surfaces, mica is the most commonly used natural substrate in measurements with the surface forces apparatus (SFA), in atomic force microscopy (AFM), and in many adsorption studies. However, preparing mica...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 20(2004), 9 vom: 27. Apr., Seite 3616-22 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2004
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |