Spatially resolved imaging of inhomogeneous charge transfer behavior in polymorphous molybdenum oxide. I. Correlation of localized structural, electronic, and chemical properties using conductive probe atomic force microscopy and Raman microprobe spectroscopy
A detailed study of electrochemically deposited molybdenum oxide thin films has been carried out after they were sintered at 250 degrees C. Conductive probe atomic force microscopy (CP-AFM), Raman microscopy, and X-ray photoelectron spectroscopy (XPS) techniques were employed to assess the complex s...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 21(2005), 8 vom: 12. Apr., Seite 3521-8 |
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| Format: | Aufsatz |
| Sprache: | English |
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2005
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |