CPM : a deformable model for shape recovery and segmentation based on charged particles
A novel, physically motivated deformable model for shape recovery and segmentation is presented. The model, referred to as the charged-particle model (CPM), is inspired by classical electrodynamics and is based on a simulation of charged particles moving in an electrostatic field. The charges are at...
| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence. - 1979. - 26(2004), 10 vom: 21. Okt., Seite 1320-35 |
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| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2004
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on pattern analysis and machine intelligence |
| Schlagworte: | Comparative Study Evaluation Study Journal Article Validation Study |