Atomic force microscopy colloid-probe measurements with explicit measurement of particle-solid separation
We describe the use of evanescent wave scattering to measure the separation between the surface of a solid and a particle that is attached to an atomic force microscope (AFM) cantilever. Termed evanescent wave atomic force microscopy, our approach involves measuring the intensity of the light scatte...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 20(2004), 18 vom: 31. Aug., Seite 7616-22 |
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| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2004
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |