Development of X-ray photoemission electron microscopy (X-PEEM) at the SRS
The use of synchrotron radiation sources for X-ray spectroscopy is a well known and developed field. The majority of applications, however, have been limited to studies of materials containing only a single phase of the element of interest. Owing to limited availability of suitable instrumentation,...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1998. - 5(1998), Pt 3 vom: 01. Mai, Seite 1108-10 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
1998
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |