Experimental comparison between the conversion electron yield and X-ray fluorescence in catalyst analysis
To evaluate the application of the conversion-electron-yield (CEY) method in catalyst analysis, the intensities of the CEY and X-ray fluorescence (XRF) as a function of glancing angle were measured simultaneously. The probing depth of the CEY method is shallower than that of the XRF method. The CEY...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1998. - 5(1998), Pt 3 vom: 01. Mai, Seite 1032-4 |
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| Format: | Aufsatz |
| Sprache: | English |
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1998
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |