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231223s1998 xx ||||| 00| ||eng c |
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|a pubmed25n0498.xml
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|a (DE-627)NLM149471483
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|a (NLM)15263729
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|a DE-627
|b ger
|c DE-627
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|a eng
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|a Harada, Y
|e verfasserin
|4 aut
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|a Spectrometer for polarized soft X-ray Raman scattering
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|c 1998
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 02.10.2012
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|a Date Revised 20.07.2004
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a An experimental system for polarized soft X-ray Raman scattering spectroscopy has been constructed. The soft X-ray spectrometer is based on the Rowland circle geometry with a holographic spherical grating. Three types of gratings are used to cover the energy range from 18 eV to 1200 eV. According to a ray-trace simulation, the resolution is expected to be 200 meV at 700 eV by using a 10 micro m slit width. The polarized and depolarized soft X-ray Raman scattering spectra can be measured by rotating the soft X-ray spectrometer around the axis of the incident beam. Preliminary measurements of polarized and depolarized spectra were accomplished at undulator beamline BL-2C of the Photon Factory
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|a Journal Article
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|a Ishii, H
|e verfasserin
|4 aut
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|a Fujisawa, M
|e verfasserin
|4 aut
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|a Tezuka, Y
|e verfasserin
|4 aut
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| 700 |
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|a Shin, S
|e verfasserin
|4 aut
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| 700 |
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|a Watanabe, M
|e verfasserin
|4 aut
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|a Kitajima, Y
|e verfasserin
|4 aut
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|a Yagishita, A
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1998
|g 5(1998), Pt 3 vom: 01. Mai, Seite 1013-5
|w (DE-627)NLM09824129X
|x 0909-0495
|7 nnns
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| 773 |
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|g volume:5
|g year:1998
|g number:Pt 3
|g day:01
|g month:05
|g pages:1013-5
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|a GBV_USEFLAG_A
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|a SYSFLAG_A
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|a GBV_NLM
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|a GBV_ILN_40
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|a GBV_ILN_350
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|a GBV_ILN_2005
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|a AR
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|d 5
|j 1998
|e Pt 3
|b 01
|c 05
|h 1013-5
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