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|a pubmed25n0498.xml
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|a (DE-627)NLM149471092
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|a (NLM)15263690
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Tabuchi, M
|e verfasserin
|4 aut
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|a Observation of composition in surface monolayers by X-ray scattering spectra caused by crystal truncation and interferences
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|c 1998
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
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|2 rdacarrier
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|a Date Completed 02.10.2012
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|a Date Revised 20.07.2004
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a X-ray crystal-truncation-rod (CTR) scattering measurements using synchrotron radiation and an imaging plate can reveal the composition of a surface monolayer. Even when the composition is changed in only one atomic layer on the top surface, the X-ray CTR spectrum can change due to the differences in composition. X-ray CTR spectra are greatly enhanced by X-ray interference when a sample is designed properly. In this paper, it is shown by theoretical calculations and experiments for AlAs/GaAs samples grown by MBE that a 1 ML (monolayer)-thick AlAs layer embedded under 10 ML below the surface can enhance the modulation of an X-ray CTR spectrum
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|a Journal Article
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|a Yokoi, M
|e verfasserin
|4 aut
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|a Ichiki, S
|e verfasserin
|4 aut
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|a Fujita, K
|e verfasserin
|4 aut
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|a Takeda, Y
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1998
|g 5(1998), Pt 3 vom: 01. Mai, Seite 899-901
|w (DE-627)NLM09824129X
|x 0909-0495
|7 nnns
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|g volume:5
|g year:1998
|g number:Pt 3
|g day:01
|g month:05
|g pages:899-901
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|a GBV_ILN_2005
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|a AR
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|d 5
|j 1998
|e Pt 3
|b 01
|c 05
|h 899-901
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