Observation of composition in surface monolayers by X-ray scattering spectra caused by crystal truncation and interferences

X-ray crystal-truncation-rod (CTR) scattering measurements using synchrotron radiation and an imaging plate can reveal the composition of a surface monolayer. Even when the composition is changed in only one atomic layer on the top surface, the X-ray CTR spectrum can change due to the differences in...

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Veröffentlicht in:Journal of synchrotron radiation. - 1998. - 5(1998), Pt 3 vom: 01. Mai, Seite 899-901
1. Verfasser: Tabuchi, M (VerfasserIn)
Weitere Verfasser: Yokoi, M, Ichiki, S, Fujita, K, Takeda, Y
Format: Aufsatz
Sprache:English
Veröffentlicht: 1998
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article
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520 |a X-ray crystal-truncation-rod (CTR) scattering measurements using synchrotron radiation and an imaging plate can reveal the composition of a surface monolayer. Even when the composition is changed in only one atomic layer on the top surface, the X-ray CTR spectrum can change due to the differences in composition. X-ray CTR spectra are greatly enhanced by X-ray interference when a sample is designed properly. In this paper, it is shown by theoretical calculations and experiments for AlAs/GaAs samples grown by MBE that a 1 ML (monolayer)-thick AlAs layer embedded under 10 ML below the surface can enhance the modulation of an X-ray CTR spectrum 
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700 1 |a Yokoi, M  |e verfasserin  |4 aut 
700 1 |a Ichiki, S  |e verfasserin  |4 aut 
700 1 |a Fujita, K  |e verfasserin  |4 aut 
700 1 |a Takeda, Y  |e verfasserin  |4 aut 
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