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231223s1998 xx ||||| 00| ||eng c |
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|a (NLM)15263554
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|a DE-627
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|c DE-627
|e rakwb
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|a eng
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| 100 |
1 |
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|a Takagi, Y
|e verfasserin
|4 aut
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| 245 |
1 |
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|a Generalized grazing-incidence-angle X-ray diffraction (G-GIXD) using image plates
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| 264 |
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|c 1998
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| 336 |
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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| 338 |
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|a Band
|b nc
|2 rdacarrier
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| 500 |
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|a Date Completed 02.10.2012
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|a Date Revised 20.07.2004
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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| 520 |
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|a A new and more 'generalized' grazing-incidence-angle X-ray diffraction (G-GIXD) method which enables simultaneous measurements both of in- and out-of-plane diffraction images from surface and interface structures has been developed. While the method uses grazing-incidence-angle X-rays like synchrotron radiation as an incident beam in the same manner as in 'traditional' GIXD, two-dimensional (area) detectors like image plates and a spherical-type goniometer are used as the data-collection system. In this way, diffraction images both in the Seemann-Bohlin (out-of-plane) and GIXD geometry (in-plane) can be measured simultaneously without scanning the detectors. The method can be applied not only to the analysis of the in-plane crystal structure of epitaxically grown thin films, but also to more general research topics like the structural analysis of polycrystalline mixed phases of thin surface and interface layers
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|a Journal Article
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|a Kimura, M
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 5(1998), Pt 3 vom: 01. Mai, Seite 488-90
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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| 773 |
1 |
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|g volume:5
|g year:1998
|g number:Pt 3
|g day:01
|g month:05
|g pages:488-90
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| 952 |
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|d 5
|j 1998
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|h 488-90
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