Depth-resolved strain measurements in polycrystalline materials by energy-variable X-ray diffraction
An energy-variable synchrotron diffraction technique is being established as a novel method for the depth-resolved measurement of residual strains in polycrystalline structures. An analytic expression for the diffraction profile is obtained by taking into account the instrument misalignment, change...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1998. - 11(2004), Pt 4 vom: 01. Juli, Seite 309-13 |
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| Weitere Verfasser: | , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2004
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |